Keyword:Geographical part average testing (GPAT)

Publications
Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu and Chia-Tso Chao EasyChair Preprint 15192